The first paper in this list is a patent for a phase
measuring device that was invented by Dan Shaddock, Brent
Ware, Robert Spero and myself. After that are papers that
I authored while at JPL.
U.S. Patent 7,511,469 for the NASA/JPL/LISA phasemeter
"Cryogenic Performance of Piezo-Electric Actuators for
Opto-Mechanical Applications," Peter G. Halverson,
Tyler J. Parker and Marie Levine, SPIE Optics and
Photonics, 26-30 August 2007, San Diego, California
"The JPL cryogenic dilatometer: measuring the thermal
expansion coefficient of aerospace materials," Peter G.
Halverson, Tyler J. Parker, Paul Karlmann, Kerry J.
Klein, Robert D. Peters, Marie Levine, ITCC 29/ITES 17
(International Thermal Conductivity Conference
29/International Thermal Expansion Symposium 17), 24-27
June 2007, Birmingham, Alabama
"Measurement of wavefront phase delay and optical
density in apodized coronagraphic mask materials,"
Halverson, Peter G.; Ftaclas, Micheal Z.;
Balasubramanian, Kunjithapatham; Hoppe, Daniel J.;
Wilson, Daniel W., Techniques and Instrumentation for
Detection of Exoplanets II, Proceedings of the SPIE,
Volume 5905, pp. 473-482 (2005).
"Search for general relativistic effects in table-top
displacement metrology," Peter G. Halverson, Daniel R.
Macdonald, Rosemary T. Diaz, 2004 CLEO/IQEC, San
Francisco, May 16-21 2004
"Progress towards picometer accuracy laser metrology
for the space interferometry mission - update for ICSO
2004," Peter G. Halverson, Oscar Alvarez-Salazar,
Alireza Azizi, Frank Dekens, Bijan Nemati, Feng Zhao,
Proceedings of the 5th International Conference on
Space Optics (ICSO 2004), 30 March - 2 April 2004,
Toulouse, France, ESA SP-554, 2004, p. 515 - 522
"Signal processing for order 10 pm accuracy
displacement metrology in real-world scientific
applications," Peter G. Halverson, Frank M Loya,
Proceedings of the 5th International Conference on
Space Optics (ICSO 2004), 30 March - 2 April 2004,
Toulouse, France, ESA SP-554, 2004, p. 571 - 577
"Signal processing and testing of displacement
metrology gauges with picometre-scale cyclic
nonlinearity," Peter G. Halverson and Robert E. Spero,
J. Opt. A: Pure Appl. Opt., Volume 4, Issue 6, pp.
S304-S310 (2002).
"Characterization of Picometer Repeatability
Displacement Metrology Gauges," Peter G. Halverson,
Lawrence S. Azevedo, Rosemary T. Diaz, Robert E. Spero,
Proceedings of ODIMAP III, the 3rd Topical Meeting on
Optoelectronic Distance/Displacement Measurements and
Applications, 20-22 September 2001, Pavia, Italy, pp.
63-68.
"Techniques for the reduction of cyclic errors in laser
metrology gauges for the Space Interferometry Mission,"
Peter G. Halverson, Feng Zhao, Robert Spero, Stuart
Shaklan, Oliver P. Lay, Serge Dubovitsky, Rosemary T.
Diaz, Ray Bell, Lawrence Ames, Kalyan Dutta,
Proceedings of the ASPE 2001 Annual Meeting, 10-15
November, Crystal City Virginia. pp.103-106 (2001)
"Progress towards picometer accuracy laser metrology
for the Space Interferometry Mission," Peter G.
Halverson, Andreas Kuhnert, Jennifer Logan, Martin
Regehr, Stuart Shaklan, Robert Spero, Feng Zhao, Tallis
Chang, Edouard Schmidtlin, Roman Gutierrez, Thomas R.
VanZandt, Jeffrey Yu, proceedings of the International
Conference of Space Optics ICSO 2000, 5-7 December
2000, Toulouse, France, pp. 417-428.
"A Multichannel Averaging Phasemeter for Picometer
Precision Laser Metrology," Peter G. Halverson, Donald
R. Johnson, Andreas Kuhnert, Stuart B. Shaklan, Robert
Spero, Optical Engineering for Sensing and
Nanotechnology (ICOSN '99), 16-18 June 1999, Yokohama,
Japan, Proceedings of the SPIE Volume 3740, pp 646-649
Complete list of Halverson publications while at JPL